摘要
Three mechanisms to reduce threading dislocations(TDs) in GaN films as the epitaxial films grow thicker are suggested by SEM and
Three mechanisms to reduce threading dislocations(TDs) in GaN films as the epitaxial films grow thicker are suggested by SEM and TEM
出处
《光学学报》
EI
CAS
CSCD
北大核心
2003年第S1期861-862,共2页
Acta Optica Sinica