摘要
本文在深低温(约10 K)下,对生长在(001)Insb 基板上的 In_(1-x)Al_xSb 单外延层,用调制反射光谱方法,首次进行了 E_1和 E_1+Δ_1光跃迁的光反射测量。温度范围从8 K 到300 K,组分 x 范围从0到0.55的样品的光反射测量结果,经计算机处理后,用图示出 E_1和 E_1+Δ_1随 x 值变化的关系。
In this article,we present the first modulation photoreflectance measurements of the E_1 and E_1+△_1 optical transitions of single epilayers of In_(1-x) Al_x Sb grown on(001)InSb. The photoreflectance measuremcnts have been performed in the temperature range 8K<T<300K and for compositions of 0<x<0.55.The results are shown in figure, E_1 and E_1+△_1 are function of compositions x.
