摘要
研究了采用感耦等离子体质谱分析高纯稀土氧化物中痕量稀土杂质时的基体谱线干扰问题。以Pr和Ho为例,定量考察了基体的质谱峰对相邻质谱的谱线干扰及其与仪器分辨率和极偏压的关系;以Y为例,研究了除氧化物和氢氧化物外的其它基体衍生物的干扰及其与仪器工作条件的关系。结果表明,高纯稀土氧化物基体浓度为mg/ml时,分辨率应控制在0.6amu以下;除基体的MO ̄+和MOH ̄+离子干扰外,还存在着比较严重的MN ̄+、和MCl ̄+的干扰;在低载流高功率测定时,基体谱线干扰可有所降低,但灵敏度也相应降低。
he deterlnination of trace rare earth impurities in high-purity rare earth oxides by ICP- MSare subjectto spectral interferences caused by matrix-induced species including MO ̄+,MH ̄+,MOH ̄+,and MCl ̄+.Detailed data and spectra are presented for Y,Pr andHo matrixes to illustrate the nature and magnitude of the interferences.These matrix-inducedspectral interferences are very important in high-purity rare earth oxides analysis aIthough some of thenl are of very low ratio to singly charged ions such asand.A very useful tableindicating potential interferences caused by matrix-induced species in analysis of high- purity rareearth oxides is given.
出处
《岩矿测试》
CAS
CSCD
北大核心
1994年第2期81-91,共11页
Rock and Mineral Analysis
关键词
稀土族
氧化物
质谱法
谱线干扰
inductively coupled plasma-mass spectrometry(ICP-MS),high-purity rareearth oxides,spectral interference