期刊文献+

航天电子系统中电子元器件选用的途径分析 被引量:17

Technical Overview of the Electronic Components Selection for Spacecraft
下载PDF
导出
摘要 针对航天电子系统中的电子元器件选用的途径———采用抗辐射加固器件和采用高性能商用器件进行了比较分析;阐述了空间飞行器采用抗辐射加固器件的优点和存在的问题,探讨了采用高性能商用器件的几种途径,抗辐射加固、冗余设计、筛选测试,以及存在的问题和面临的风险;以神舟四号飞船中商用器件的使用作为筛选测试的空间应用实例,给出了其在轨飞行的试验结果;并提出了商用器件的筛选测试必将成为商用器件空间应用的一个新的发展趋势。 This paper analyses the two components selection approaches of using the radiation-hardened components and Commercial-Off-the-Shelf (COTS) components in space electronic systems, expounds the advantages and the problems of radiation-hardened components used in spacecraft, and discusses the several approaches, the problems and risks of COTS components in space application. Through the several approaches such as redundant design, radiation-hardened design, or screening and test, COTS components can be used to meet the requirements of high performance for spacecraft. As the application example of the screening and test of COTS, the onboard experimental results of Chinese Shenzhou-4 spaceship with a COTS are presented. The screening and test of COTS components will become a new tendency of COTS in space application.
出处 《电子器件》 EI CAS 2005年第1期38-43,共6页 Chinese Journal of Electron Devices
基金 国家自然科学基金(60372021) 中国科学院知识新工程领域前沿项目(2510A1S)共同资助。
关键词 抗辐射加固 电子元器件 空间应用 商用 电子系统 测试 冗余设计 航天 神舟四号飞船 在轨飞行 spacecraft commercial-off-the-shelf (COTS) anti-radiation screening and test space application
  • 引文网络
  • 相关文献

参考文献18

  • 1潘科炎,王长龙.星载数字电子设备的辐射加固技术(一)[J].航天控制,1998,16(3):67-75. 被引量:8
  • 2许盛柯,华更新,郭树玲.单板双机嵌入式486容错子系统的设计[J].航天控制,2003,21(1):22-26. 被引量:4
  • 3NEPP-Plastic Encapsulated Microcircuits (PEMs), NASA/GSFC PEMs Policy, NASA Privacy Statement, March 26, 2003.
  • 4Michael C Maher, Can. COTS Products Be Used in Radiation Environments[J]. COTS Journal, December 2003.
  • 5Sammy Kayali. Utilization of COTS Electronics in Space Application, Reliability Challenges and Reality[C].In: 6th International CMSE Conference, Feb.12-14, 2002.
  • 6华更新,王国良,郭树玲,艾蔚,许盛柯,于坤.星载计算机抗辐射加固技术研究[J].控制工程(北京),2002(4):20-30. 被引量:3
  • 7Mike Sandor. Plastic Encapsulated Microcircuits (PEMs) Reliability/ Usage Guidelines For Space Applications, Office 514 Electronic Parts Engineering D-19426, October 9,2000, Jet Propulsion Laboratory California Institute of Technology, Pasadena, California.
  • 8NEPP-NASA PEMs Policy White Paper-BASIS FOR GSFC POLICY ON THE USE OF PEMs, Feberary 26,2002.
  • 9Alexander Teverovsky, Kusum Sahu. Instructions for Plastic Encapsulated Microcircuit Selection, Screening and Qualification, NASA/TP-2003-212244 Goddard Space Flight Center, June 2003.
  • 10Chuck Barnes, Mike Sampson, Enabling COTS Parts Insertion in NASA Systems: A Combined NEPAG (Q, AE) - NEPP Program (AE) Activity, NASA S&MA Directors' Meeting Dryden Flight Research Center, October 10, 2002.

二级参考文献20

  • 1王长龙,沈石岑,张传军.星载设备抗单粒子效应的设计技术初探[J].航天控制,1995,13(3):24-30. 被引量:4
  • 2华更新.386EX芯片单粒子效应试验.第四届卫星抗辐射加固技术学术交流文集[M].兰州:中国空间技术研究院,1999.160-166.
  • 3杨孟飞.检测80C86发生SEU的方法研究.第三届卫星抗辐射加固技术学术交流会[M].,-..
  • 4唐民.同步轨道气象卫星用80C31微控制器单粒子效应敏感度评估.第三届卫星抗辐射加固技术学术交流会[M].,-..
  • 5华更新.386ex芯片总剂量效应试验.第四届卫星抗辐射加固技术学术交流会[M].,-..
  • 6曹洲.空间带电粒子屏蔽分析计算.第四届卫星抗辐射加固技术学术交流会[M].,-..
  • 7Lattice公司.可编程器件PLD1032总剂量试验报告[M].,-..
  • 8孟庆茹.总剂量对80C31和HM65126的单粒子效应影响.第三届卫星抗辐射加固技术学术交流会[M].,-..
  • 9胡谋主编.计算机容错技术[M].中国铁道出版社,1998..
  • 10Katz R,IEEE Transactions Nuclearscience,1998年,45卷,6期,2600页

共引文献21

同被引文献197

引证文献17

二级引证文献130

;
使用帮助 返回顶部