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合肥储存环注入脉冲电源电路触发可靠性改善研究 被引量:2

Improving the Reliability for the Triggering of Injection Pulse Power Supply Circuit in Hefei Storage Ring
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摘要 由合肥电子储存环注入系统输出数千安培电流脉冲的脉冲电源短路过载与同步关系不稳定现象,研究了该系统脉冲电源电路应满足的等时触发关系式和触发电路,认为脉冲电源原设计的触发电路缺少抑制强干扰的功能.还研究了前沿触发门闩电路对时钟脉冲的选通能力和干扰脉冲的抑制能力,认为前沿触发门闩电路在强干扰环境下,具有很强的抑制干扰作用.用前沿触发门闩电路改进合肥储存环注入系统脉冲电源取得了良好的效果. In this paper the criteria for the time invariant traier property and the trigger Circuits of the pulse power supplied are Studied from shorting overload and from their synchronous condition unstabilities with outputing current pulse of thousands of amperes, It is held that there wasn't any function to suppress strong interference trigger in primary trigger circuits in the injeCtion system of Hefei election storage ring. The selective function to timer pulse and suppressive function to Strong interference pulse of the leading edge triggered gate-latch circuit are described, and it is held that it possesses the suppressive function to Strong interference pulse in a Strong electromagnetic enviroment. A good result in the commissioning is achieved, by improving the pulse power supplies of the injection system with the leading edge triggered gate-latch circuit.
作者 王相綦
出处 《中国科学技术大学学报》 CAS CSCD 北大核心 1994年第4期536-541,共6页 JUSTC
关键词 触发 储存环 脉冲电源电路 注入系统 可靠性 time interval invariant, time invariant triggered, leading edge triggered, end edge triggered, gate-latch circuit, gate state, latch state, return to gate state, latch duration
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  • 1褚宗兰,1988年
  • 2王相綦,1988年
  • 3张适昌,1988年
  • 4张恩官,1983年
  • 5裴元吉,1981年
  • 6王相綦,1981年

共引文献1

同被引文献43

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  • 2戴广明,田为,黄军.新型大功率全固态调制器[J].电力电子技术,2004,38(5):63-65. 被引量:23
  • 3王相綦,冯德仁,尚雷,裴元吉,何宁,赵涛.磁矩进动阻尼引起相位滞后的实验测量和理论分析[J].物理学报,2004,53(12):4319-4324. 被引量:4
  • 4王相綦,何宁,冯德仁.基于CPLD﹑单片机和网络的固态调制器触发控制[J].核技术,2006,29(4):241-244. 被引量:5
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