基于IEEE1149．1标准的通用测试机的设计与实现

Design and Realization of General Tester Based on IEEE1149.1 Standard

针对板级或系统级电路的测试问题,本文提出了一种基于IEEE1149．1标准的通用测试机的设计方案,从而实现了对被测电路的在线和离线测试。此外,由于DSP、FPGA等嵌入式技术的使用,使整个系统具有体积小、功耗低、通用性好和便于嵌入到被测电路板等特点。

For solving the test problems of circuits on board-stage or system-stage, the design scheme of general tester based on IEEE 1149.1 standard is presented in this paper. The tester can realize circuits＇ on-line and off-line tests. In addition, by using an embedded technology, such as DSP, FPGA etc, the tester will have the features of small-size, low-cost, general-purpose and easy-embedment.