原子力显微镜原理与应用技术

The principle and using technology of atomic force microscopy

本文简述原子力显微镜的工作原理,对比说明敲击模式的优越性,指出针尖-样品卷积效应和假象产生的原因,并例证其应用领域及其测试效果。

This thesis gives a brief introduction to working principle of atomic force microscopy,illuminates the superiority of tapping mode by constrast, points out tip-sample convolution and reasons that cause sham images, illustrates application fields and testing effects.