期刊文献+

静电放电模拟器校验装置研究 被引量:1

Research of ESD Generator Verification System
下载PDF
导出
摘要 静电放电模拟器校验装置,根据IEC 61000-4-2标准设计。其电流靶通过同轴电缆与示波器相连,电缆两端则与BNC头连接,负责将ESD电流转换成电压信号供示波器测量。示波器带有软盘驱动器,能将数据以EXCEL格式或位图形式存入软盘,供微机打印波形和校验报告。该装置能自动采集静电放电电流波形。通过对该系统的不确定度分析,证实系统完全符合要求。 According to IEC1000-4-2 electrostatic measurement standard, design an ESD generator verification system. Its current targets connect with oscillograph via coaxial-cable. The two ends of cable connect with BNC pin and transform ESD current into voltage signal. The oscillograph has disk driver and stores the data in disc by EXCEL form or bitmap form for printing wave and verification reports. The system could automatically display the ESD current wave. Though evaluating its uncertainty, the system is absolutely accordant with the standard.
出处 《兵工自动化》 2007年第5期78-80,共3页 Ordnance Industry Automation
关键词 静电放电 电流波形 测量不确定度 ESD Current curve Measurement uncertain degree
  • 相关文献

参考文献8

二级参考文献28

  • 1孙可平 宋广成.工业静电[M].北京:国防工业出版社,1996.26-89.
  • 2RobertA Witte 何小平译.电子测量仪器原理与应用[M].北京:清华大学出版社,1995..
  • 3[1]Basic EMC Publication. Electrostatic discharge immunity test. IEC 1000-4-2 Electromagnetic compatibility(EMC) Part 4: Testing and measurement techniques-Section 2:
  • 4[2]Tektronix. TDS 500C,TDS600B & TDS700C Digitizing oscilloscopes performance verification and Specifications. 070-9874-01
  • 5[2]IEC 1000-4-2 Electromagnetic compatibility (EMC)Part 4: Testing and measurement techniques - Section 2: Electrostatic discharge immunity test. Basic EMC Publication.
  • 6[3]Tektronix. TDS 500C, TDS600B & TDS700C Digitizing Oscilloscopes Performance Verification and Specifications. 070-9874 - 01.
  • 7[4]Model 139D Brandenburg HV meters Operating Manual.
  • 8[5]Schaffner ESD Simulator NSG 435 Operating Instructions.
  • 9Yu Chang, Michael Rudko, Chang-Yu Wu. Simplified circuit modeling of ESD waveform [C]// Conference Record of the 1991 IEEE Industry Applications Society Annual Meeting. Dearborn, Michigan, USA: 603-609.
  • 10David Pommerenke. ESD: transient fields, are simulation and rise time limit[J]. J Electrostatics, 1998, 44:191-203.

共引文献44

同被引文献3

  • 1李网生,夏贤江,蒋云彬,徐功潜.固态开关器件的串联技术[J].电力电子技术,2004,38(6):92-93. 被引量:10
  • 2IEEE Std C62,38-1994(IEEE Guide on Electrostatic Discharge (ESD):ESD Withstand Capability Evaluation Methods(for Electronic Equipment Subassemblies)[S], 1994.
  • 3Ben G Srteetman, Sanjay Banerjee.固体电子器件[M].杨建红译.兰州:兰州大学出版社,2005.

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部