多晶铜中晶界发射位错的动态电镜观察

The observation of Emitting Dislocations from Grain Boundaries by Transmission Electron Microscope

本文介绍了纯铜试样拉伸过程中晶界发射位错的透射电子显微镜动态观察结果。表明面心立方多晶纯铜晶界中也存在“坎”,在应力的作用下,“坎”向晶粒内部发送位错。

The in situ observations of emitting dislocations from grain boundaries by a transmission electron microscopy for pure copper during elongation have been performed, It is shown that there also exists 'ledge' at the grain boundaries in f. c. c. pure copper, under action of stress, which is able to emit dislocation into grain.