基于March算法的存储器测试控制器设计

Design of a Memory Test Controller Based on March Algorithm

随着soc设计向存储器比例大于逻辑部分比例的方向发展,存储器的品质直接影响着soc的整体性能的提高,故对于存储器测试显得尤为重要。现在存在的一些存储器测试方法对故障的覆盖率都不能达到100%。本文分析了现有的各种March算法,提出了一种新的存储器测试控制器设计方法,它综合调配各种March算法,使测试的故障覆盖率接近100%,并且硬件开销很小。

With the development that the memory design takes most part of the System on chip than the logic design, the high quality test of memory seems to be very important particularly because the memory quality affect the improvement of the soc directly. But the fault coverage of memory test algorithm cannot achieve 100% now. The mostly used test algorithm-March Algorithm discussed at first. Based on March algorithm, the new test controller is proposed. It can synthesize every kinds of the March algorithm, while the fault coverage is nearly to 100% and the hardware overhead is quit small.