化学计量学与X射线荧光光谱分析

The Application of Chemometrics to X_Ray Fluorescence Analysis

简要回顾了Ｘ＿射线荧光分析中数学校正模型的发展进程；阐述了基体校正方程与化学计量学之间的关系；介绍了偏最小二乘回归、神经网络、专家系统和模式识别等近期研究成果；以及轻元素测定、微束和薄层分析等数据处理技术。

Recent work on chemometrics in X_ray fluorescence analysis is reviewed. Emphasis is placed on partial least squares, pattern recognition, neural networks and expert system, because thier extensive use in analytical chemistry and important role in X_ray fluorescence analysis. In addition, special attention is also paid to the development of microbeam X_ray fluorescence, coating and thin films, and light element analysis.