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A Simple Model for Measuring Refractive Index of a Liquid Based upon Fresnel Equations 被引量:2

A Simple Model for Measuring Refractive Index of a Liquid Based upon Fresnel Equations
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摘要 Due to many experimental data required and a lot of calculations involved, it is very complex and cumbersome to model prism-based liquid-refractive-index-measuring methods. We develop a new method of mathematical modelling for measuring refractive index of a liquid based upon the Fresnel formula and prism internal reflection at an incident angle less than the critical angle. With this method, only two different concentrations measurements for a kind of solution can lead to the determination of computational model. Measurements are performed to examine the validity of the theoretical model. Experimental results indicate the feasibility of the theoretical model with an error of 1%. The method is also capable of measuring even smaller changes in the optical refractive index of the material on a metal surface by the surface plasma resonance sensing techniques. Due to many experimental data required and a lot of calculations involved, it is very complex and cumbersome to model prism-based liquid-refractive-index-measuring methods. We develop a new method of mathematical modelling for measuring refractive index of a liquid based upon the Fresnel formula and prism internal reflection at an incident angle less than the critical angle. With this method, only two different concentrations measurements for a kind of solution can lead to the determination of computational model. Measurements are performed to examine the validity of the theoretical model. Experimental results indicate the feasibility of the theoretical model with an error of 1%. The method is also capable of measuring even smaller changes in the optical refractive index of the material on a metal surface by the surface plasma resonance sensing techniques.
出处 《Chinese Physics Letters》 SCIE CAS CSCD 2007年第11期3133-3136,共4页 中国物理快报(英文版)
关键词 coated conductor buffer layer self-epitaxy CEO2 coated conductor, buffer layer, self-epitaxy, CeO2
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