摘要
由于Teradyne J750测试系统测试速度快,为节省机时,也顺应测试行业的发展,越来越多的程序开始在Teradyne J750测试平台上开发。下面以82C52芯片为例,介绍了在TeradyneJ750测试系统上测试程序的开发。
At present, in order to meet the requirements of IC testing. A high efficiency testing system, J750, are widely used to follow the development of testing industry. The author shows us how to debug the testing programs on Teradyne J750 with an example of 82C52.
出处
《微处理机》
2008年第2期36-37,共2页
Microprocessors
