期刊文献+

Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs 被引量:1

Considerations of dopant-dependent bandgap narrowing for accurate device simulation in abrupt HBTs
原文传递
导出
摘要 Heavy doping of the base in HBTs brings about a bandgap narrowing (BGN) effect, which modifies the intrinsic carrier density and disturbs the band offset, and thus leads to the change of the currents. Based on a thermionic-field-diffusion model that is used to the analyze the performance of an abrupt HBT with a heavydoped base, the conclusion is made that, although the BGN effect makes the currents obviously change due to the modification of the intrinsic carrier density, the band offsets disturbed by the BGN effect should also be taken into account in the analysis of the electrical characteristics of abrupt HBTs. In addition, the BGN effect changes the bias voltage for the onset of Kirk effects. Heavy doping of the base in HBTs brings about a bandgap narrowing (BGN) effect, which modifies the intrinsic carrier density and disturbs the band offset, and thus leads to the change of the currents. Based on a thermionic-field-diffusion model that is used to the analyze the performance of an abrupt HBT with a heavydoped base, the conclusion is made that, although the BGN effect makes the currents obviously change due to the modification of the intrinsic carrier density, the band offsets disturbed by the BGN effect should also be taken into account in the analysis of the electrical characteristics of abrupt HBTs. In addition, the BGN effect changes the bias voltage for the onset of Kirk effects.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2009年第4期30-33,共4页 半导体学报(英文版)
基金 supported by the State Key Development Program for Basic Research of China (No. 2003CB314901)
关键词 HBTS bandgap narrowing intrinsic carrier density band offsets Kirk effects HBTs bandgap narrowing intrinsic carrier density band offsets Kirk effects
  • 相关文献

参考文献12

  • 1Ahn H, Ei-Nokali M, Han D Y. An efficient algorithm for optimizing the electrical performance of HBT's. Int J Numer Model, 2003, 16(4): 353.
  • 2Mohammad S N. Doping induced design considerations for InP/In0.53Ga0.47As heterojunction bipolar transistors. Solid- State Electron, 2002, 46(6): 867.
  • 3Palankovski V, Grujin G K, Selberherr S. Study of dopantdependent band gap narrowing in compound semiconductor devices. Mater Sci Eng, 1999, B66:46.
  • 4Reddy K V, DasGupta A. A unified analytical model for charge transport in heterojunction bipolar transistors. Solid-State Electron, 2004, 48(9): 1613.
  • 5Shi Y, Niu G, Cressler J D, et al. On the consistent modeling of band-gap narrowing for accurate device-level simulation of scaled SiGe HBTs. IEEE Trans Electron Devices, 2003, 50(5): 1370.
  • 6Lopez J M, Prat L. The importance of bandgap narrowing distribution between the conduction and valence bands in abrupt HBTs. IEEE Trans Electron Devices, 1997, 44(7): 1046.
  • 7Yang K, East J R, Haddad G I. Numerical modeling of abrupt heterojunction using a thermionic-field emission boundary condition. Solid-State Electron, 1993, 36(3): 321.
  • 8Yang K, East J R, Haddad G I. Numerical study on the injection performance of AlGaAs/GaAs abrupt emitter heterojunction bipolar transistors. IEEE Trans Electron Devices, 1994, 41(2): 138.
  • 9Grinberg A A, Shur M S, Fischer R J, et al. An investigation of the effect of graded layers and tunneling on the performance of AlGaAs/GaAs heterojunction bipolar transistors. IEEE Trans Electron Devices, 1984. 31(12): 1758.
  • 10Liu W. Fundamentals of III-V devices: I-IBTs, MESFETs, and HFETs/HEMTs. USA: John Wiley & Sons, 1999.

同被引文献9

引证文献1

二级引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部