基于LabVIEW的存储器检测系统研究

Research on Test System of Memory Based on LabVIEW

针对某装备的存储器没有相应的测试设备,测试内容比较繁琐,设计了基于LabVIEW的存储器检测系统。硬件依托PXI测试总线予以实现,具有可靠性高,灵活性强的特点。针对组合存储器的特点,设计了专用的接口适配器,主要用于实现信号的同步和调理。文中分析了存储器的故障类型,研究March算法并进行了扩展。系统以LabVIEW作为软件工具,实现了对存储器的自动测试,用数据库实现了测试算法与测试程序的分离。该系统具有操作容易,可扩展性强等特点,有效提高了对某装备存储器的测试效率。

Aimming at the memory of certain equipment doesn＇t have test equipment,and the content of test is complex, a test system of memory is designed based on LabVIEW. The hardware relays on PXI bus, which has high reliability and flexbility, According to requirement analysis,private adapter is used to realize synchronous signal. The fault type of memory is ana lysed, March algorithm is reasearched and expanded. The system uses LabVIEW as software tool to carry out auto test of the memory,uses database to achieve the test algorithm and test software is separated. The system has some characters such as easy handle and srong extensible. The system improves test efficiency of memory of a certain equipment.