红外探测器比探测率与光学系统工作温度关系研究

Study on the Relationship between the Infrared Detectors Background Limit Detectiviy and the Optical Systems Work Temperature

针对低温光学系统自身辐射与红外探测器比探测率(D*)的关系,从红外辐射基本理论入手,建立了光学系统工作温度与背景限红外探测器D*之间的关系模型。由此计算出了典型四反光学系统不同工作温度下、不同谱段的背景限红外探测器D*值,综合考虑探测器处于非背景限情况,得出相关曲线;总结出了背景限红外探测器与光学系统工作温度之间关系的几点体会。

After analyzing the relationship between the IR detectors background limit detectivity and the optical systems work temperature,a mathematics model was obtained according to the theory of infrared radiation.This model was used to calculate IR detectors background limit detectivity under the different optical system（this paper chose a coaxial four-reflective system） temperature and different spectrums,and gained a correlation curve.Based on the calculation result,this paper summed up several important conclusions.