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非插入式器件的测量 被引量:1

Measurement of non-insertable device
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摘要 利用矢量网络分析仪测试射频微波器件时,经常需要对非插入式器件进行测量,去除适配器的影响。介绍了一种去除适配器影响的测量方法,通过单端口测试未知特性的转接器,根据假设条件和算法,使级联后理论计算值接近实际测量值,进而确定转接器的真实值,最终得到被测件的准确值,并且验证得到正确的实验结果,从而去除转接器在测试中对被测件的影响。为进一步展开端口延伸和去嵌入技术的研究奠定理论基础。 Non-insertable devices should always be measured to remove the impact of adaptors when testing microwave and RF devices.This paper presents a measurement approach to remove the effect of adaptors.Testing an unknown adaptor and making the calculated value for the cascade close to the actual measured value according to the assumeptions and algorithms.Then the true value of the adaptor is gotten and the exact value of device under test(DUT) is finally gotten.The results are correctly verified.Thus the impact of the adaptor for DUT is removed.Laying theoretical foundation for further research of port extension and de-embedding techniques.
作者 李力 年夫顺
出处 《国外电子测量技术》 2012年第4期91-93,97,共4页 Foreign Electronic Measurement Technology
关键词 矢量网络分析仪(VNA) 适配器 S参数 反射系数 vector network analyzer(VNA) adapters S paramaters reflection coefficient
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