摘要
为满足多种存储器的测试需求,基于LabVIEW和FPGA设计了一套存储器测试系统;系统分为上位机及下位机两个部分,其上位机部分采用LabVIEW开发测试控制器,完成系统的测试控制、测试数据的采集与存储及对传统仪器的程序控制;下位机部分采用FPGA实现测试所需要的测试激励生成,经实测验证了系统可以对专用存储器进行自动化监控测试,具有测试成本低测试灵活及可扩展性强等特点。
Abstract： As to meet the needs for memory testing, a memory testing system based on LabVIEW has been designed. In this system we use LabVIEW to develop interface depending on PC to accomplish the controlling , gathering and storing the test data in real time, and use the FPGA to provide processing unit. It is an automatic system. After testing many SRAMS in the lab using this system it proves that this system has the characteristic of little cost, extensible, as well as testing conveniency.
出处
《计算机测量与控制》
CSCD
北大核心
2012年第7期1763-1765,1772,共4页
Computer Measurement &Control
基金
国家重大科技专项(2009zx02306-003)
