摘要
本文对光谱灵敏度的测试原理进行了简要的阐述,重点讨论了测试方法和实现的手段。文中所提出的测试方案,在光路设计、微弱信号的采集、标准探测器的选择、数据处理和输出方式都有自己的特点。测试装置在380~800nm 范围内能准确而方便地获得各类光电器件的光谱响应曲线和相对光谱灵敏度的数据。
A spectrum sensitivity measuring method and the testing principleof photoelectric devices are discussed.Emphasis is put upon the sele-tion of optical-mechanical system and testing scheme,the collectionof weak signal,the data processing and output.The curves of spectrumresponse and the data of relative sensitivity may be obtained by thetesting set.This testing set measuring method may be applied to vari-ous photoelectric devices in the region of 380—800nm.
出处
《光电子技术》
CAS
1990年第2期33-37,共5页
Optoelectronic Technology