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微波放大器用高灵敏度相位噪声测试系统 被引量:1

A Highly Sensitive phase Noise Measurement System for Microwave Amplifiers
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摘要 该系统是在二端口器件相位噪声测试原理电路的基础上加入载波抑制电路和调相校准信号形成电路而组成,具有合适的激励源和先进的测试终端。该系统工作在3cm波段,能测定连续波工作状态下及脉冲工作状态下被测放大管的剩余相位噪声,在偏离载波频率1KHz处的本底噪声小于-130dBc/Hz。 This paper first describes the fundamentals of two-port phase noise measurement for microwave amplifiers and other devices. On the basis of the fundamental circuit, we have set up a highly sensitive phase noise measurement system, which contains a carrier suppression circuit, a phase modulation signal generation circuit, an appropriate exciting source and a set of advanced test equipment. The operating frequencies of the system are at 3cm band. The system can be used to measure the residual phase noise of amplifiers under test which can be operated under the condition of CM and PM. The background noise of the syste-m is less than-130dBc/Hz at 1kHz offset frequency.
出处 《电子学报》 EI CAS CSCD 北大核心 1991年第3期36-41,共6页 Acta Electronica Sinica
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