摘要
目前，国外对塑封微电路（ＰＥＭ）的可靠性研究主要集中在如下几个方面：ＰＥＭ的低温分层、失效分析、鉴定试验、长期贮存可靠性评价以及ＰＥＭ在军用电子设备中的应用等，对此进行了综述。
Reliability research of PEM abroad focused on delamination of PEM at low temperature, failure analysis, qualification testing, reliability evaluation for long - term storage and the application of PEM to military electronic equipment. In this paper, a review of the advance of related researches was presented.
出处
《电子产品可靠性与环境试验》
2000年第6期45-49,共5页
Electronic Product Reliability and Environmental Testing
