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微带器件双端口测试的校准件设计

Calibration Standard Design Based on the Microstrip Dual-Port Test
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摘要 通过校准修正矢量网络分析仪全部12项系统误差,利用Matlab程序实现了SOLT(short、open、load、through)和TRL(through、reflect、line)校准算法,去除误差项,得到真实的S参数.通过与矢网校准结果相对比验证了算法和程序的正确性,并在此基础上制作了SOLT和TRL微带结构校准件,并成功用于滤波器测试. Short, open, load, through (SOLT) and through, reflect, line (TRL) calibration techniques were described. The 12-term system errors for two-port calibration were shown, and the actual S-parame- ters device was derived from the measured S-parameters by using matlab programs. Comparison between the matlab programs results and the vector network analyzer measurement data validated the correctness of the calibration approaches and procedures. The SOLT and TRL microstrip calibration standards were de- signed for microstrip filter measurement
出处 《北京邮电大学学报》 EI CAS CSCD 北大核心 2013年第5期1-5,共5页 Journal of Beijing University of Posts and Telecommunications
基金 国家自然科学基金项目(61072009) 毫米波国家重点实验室项目(K201209) 中央高校基本科研业务费专项项目
关键词 校准件 系统误差 校准算法 S参数测量 calibration standard system errors calibration algorithm S-parameters measurement
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参考文献6

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二级参考文献7

  • 1Agilent E5070B/E5071B ENA Series RF Network Analyzers User's Guide[S],Third Edition,Agilent Part No.E5070-90050,July 2003.
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