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磁控溅射Fe-N薄膜的结构和性能 被引量:2

STRUCTURE AND MAGNETIC PROPERLIES OF Fe-N FILMS PREPARED BY MAGNETRON SPUTTERING
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摘要 研究了氮流量对磁控溅射Fe-N薄膜的磁性和结构的影响.加氮薄膜的软磁性能明显优于纯铁的.当氮的流量为1.0mL·min^(-1)时,矫顽力 H_c达到最小值205A/m.当氮流量为0.8mL·min_(-1)时,饱和磁化强度达到M_s=2.36T.在 Fe-N薄膜中未发现γ’-Fe4N和 α”-Fe16N2. The changes of soft magnetic properties and structure with nitrogen flow rate for Fe-N films prepared by magnetron sputtering on Si(111) substrates at room temperature have been investigated. The soft magnetic properties of films incorporated with nitrogen are better than these of pure iron film. The lowest coercivity (Hc=205A/m) is obtained at nitrogen flow rate of 1.0 mL.min-1, and the highest saturation magnetization (Ms=2.36T) at 0.8mL.min-1. Only α-Fe nitrogen solid solution was found in the Fe-N films and α'-Fe16N2 or γ'-Fe4N phase was not found in this study.
出处 《材料研究学报》 EI CAS CSCD 北大核心 2000年第6期647-651,共5页 Chinese Journal of Materials Research
基金 国家自然科学基金资助项目!19890310.
关键词 磁控溅射 饱和磁化强度 FE-N薄膜 结构 magnetron sputtering, Fe-N films, saturation magnetization, coercivityd
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参考文献2

  • 1马如璋,材料物理现代研究方法,1997年,215页
  • 2Wang S,J Appl Phys,1990年,67卷,5134页

同被引文献10

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  • 2TAKAHASHI M, TAKAHASHI H, NASHI H, et al. Structure and magnetic moment of α″ - Fe16N2 compound films: Effect of Co and H on phase formation [ J]. Journal of Applied Physics, 1996, 79:5564-5569.
  • 3ZHOU Jian-ping, LI Dan, GU You-song, et al. The structure and magnetic properties of Fe - N thin films [J]. Science in China, 2002, 45:255 - 263.
  • 4WANG H Y, MITANI S, MOTOKAWA M, et al. Effect of high magnetic fields on the morphology of soft magnetic α'- FeN films [ J ]. Journal of Applied Physics, 2003, 93:9145 - 9150.
  • 5TURKOVIC A, DUBCEK P, CRNJAK-OREL Z, et al. Small angle scattering of synchrotron radiation on nanosized CeO2 and CeO2 - SnO2 thin films obtained by sol-gel dip-coating method [ J ]. NanoStruetured Materials, 1999, 11:909 -915.
  • 6DURAND O, BERGER V, BISARO R, et al. Determination of thicknesses and interface roughnesses of GaAs- based and InAs/AlSb-based heterostructures by X-ray reflectometry [ J ]. Materials Science in Semiconductor Processing, 2001,4:327 - 330.
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  • 8LINDSTROM T, ISIDORSSON J, NIKLASSON G A. Surface smoothing and roughening in sputtered SnO2 films [J]. Thin Solid Films, 2001, 401:165-170.
  • 9周剑平,李华飚,乔袆,张永平,顾有松,常香荣,赵春生,田中卓.磁控溅射Fe-N单层膜的研究[J].金属功能材料,2000,7(3):27-31. 被引量:1
  • 10李华飚,乔祎,周剑平,赵春生,张永平,常香荣,田中卓.磁控溅射Fe-N薄膜及Fe-N/TiN多层膜的结构和磁性[J].真空科学与技术,2000,20(5):311-314. 被引量:4

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