摘要
用一系列生成元模拟了具有不同特征的、与原子力显微镜图像相似的规则粗糙表面。详细讨论了规则粗糙表面多重分形谱参数的意义。并通过与方均根粗糙度 (rms)和简单分形维数D0 的比较 ,描述了多重分形分析的优点。
Regularly rough surfaces, similar to the atomic force microscope (AFM) images, with different characteristics have been simulated by generation units. The parameters of multifractal spectrum obtained from the regularly rough surfaces have been discussed in detail. Merits of the multifractal analysis are demonstrated by comparing these parameters with root mean square roughness (rms) and simple fractal dimension D 0. The surface topographies of ZnO films and polymer PtBuA thin films measured by AFM are analyzed by multifractal.
出处
《电子显微学报》
CAS
CSCD
北大核心
2002年第3期307-316,共10页
Journal of Chinese Electron Microscopy Society
基金
NationalNatureScienceFoundationofChina (No .1 0 0 2 5 42 0
2 0 0 75 0 2 6 )
FoundationforHighPerformanceComputing
FoundationofChineseEducationCommitteeandFoundationofChineseAcademyofScience