摘要
描述了一种适用于凹、凸球面,凹、凸透镜,非球面透镜,平面,柱面以及透镜系统等常规光学检验的新型全息干涉系统。该系统结构简单,调整方便,并可以用作检验大口径光学元件而勿需同样尺寸的高质量参考光学件。
A simple holographic system is described which can be used for routine interf erometric tests of concave and convex spherical surfaces and cylindrical surfaces as well as lenses and lens systems. The system can be set up and adjusted quite easily and used to test large-aperture optical elements without high quality reference optics of the same size.
出处
《中国激光》
EI
CAS
CSCD
北大核心
1991年第8期578-582,共5页
Chinese Journal of Lasers
关键词
光学检验
全息干涉仪
干涉仪
hologram, holographic interferometer, pinhole, spatial-frequency filtering, phase conjugation