基于MEMS压阻传感器的低功耗高过载测试系统设计

MEMS piezoresistive sensor based design of low-power consuming and high-overloaded testing system

为了检验弹体在高冲击环境下的工作情况,提出了一种基于压阻传感器的高过载、低功耗的测试系统设计方案。该系统可承受2×105 g的过载冲击测试,且具有采样率高、体积小、功耗低的特点。通过打靶实验验证:在过载测试过程中该系统具有承受高冲击的能力,并能精确地采集到信号微弱变化,保证了弹体在飞行中记录数据的准确性。

To investigate the working conditions of a missile in a high-impact environment,this paper presents a design scheme for low-power consuming and high-overload testing system based on an MEMS apiezoresistive sensor.The system is capable of withstanding tests with a 2×105 goverloaded impact and possesses such characteristics as a high sampling rate,a small volume,and a low-power consumption.As validated by our targeting experiments,the system was able not only to withstand a high overloaded impact but also to accurately capture the slight variations of a weak signal,which ensures the accuracy of the data recorded by the missile in flight.