摘要
如何快速又精确地输出低噪声放大器的测试值并使测试值符合测试规范是研究重点。基于多个测试仪器对低噪声放大器的特性参数进行测试开发。矢量网络分析仪完成S参数的测试,噪声测试仪完成噪声系数测试,信号源与频谱仪配合完成三阶交调交叉点测试,信号源与功率计配合完成1 d B增益压缩点测试。通过GPIB或TCP/IP实现仪器通信,使用计算机编程对整个流程实现自动控制,最后将测试结果返回计算机并显示,测试结果符合规范。实验证明,在实际应用中该方法快速精确并具有很好的通用性,可拓展到其他芯片的测试。
The paper focuses on fast and accurate LNA output method that meets required specifications. The paper analyzes the LNA parameters derived from several test instruments. The vector network analyzer tests S parameters; the noise test device tests noise factor; signal generator and spectrum instrument performs IP3 test; signal generator and power meter completes 1 dB gain compression point test. The whole process is automatic controlled by computer while the instrument communications is via GPIB or TCP/IP. The measurement results displayed in the end meet the specifications. The experiment demonstrates that the automatic test method is fast and precise and application to other IC tests can be expected.
出处
《电子与封装》
2016年第11期7-9,22,共4页
Electronics & Packaging
关键词
低噪声放大器
S参数
噪声系数
low noise RF amplifier (LNA)
S parameters
noise factor