CaCu3Ti4O12陶瓷的制备及低温介电弛豫研究

Preparation and Low Temperature Dielectric Relaxation of CaCu_3Ti_4O_(12) Ceramics

利用传统的固相反应法在不同条件下制备CaCu_3Ti_4O_(12)(CCTO)介电陶瓷,通过粉末XRD测试对其结构进行表征,以获得纯相CCTO陶瓷的合成条件.XRD结果表明,1 100℃/12 h烧结条件下制备的CCTO陶瓷结晶性好且为纯相;介电测试表明,样品在低温下存在介电弛豫,分析表明低温介电弛豫来源于晶粒的本征效应.

CaCu3Ti4O12 dielectric ceramics were prepared under different conditions using solid state reaction method,and powder XRD was performed to conform the pure crystal structure. XRD results show that the preparation of CCTO ceramic is pure phase and has good crystallinity which under 1 100 ℃/12 h sintering conditions.The dielectric measurement results suggest that there is dielectric relaxations at low temperature,which originates from the intrinsic properties of crystalline grains.