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Structure and Dielectric Properties of Sb_2O_5-Doped ZrO_2-SnO_2-TiO_2 Microwave Ceramics

Structure and Dielectric Properties of Sb_2O_5-Doped ZrO_2-SnO_2-TiO_2 Microwave Ceramics
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摘要 The microwave dielectric properties of ZrO2-SnO2-TiO2 (ZST) system ceramics were studied as a function of the amount of Sb2O5 dopant. With the addition of 0-0.5% Sb2O5(molar ratio), the substitution of Ti4^+ ions with Sb^5+ ions decreased the sintering temperature and increased the quality factor Q due to the reduction of oxygen vacancies, When the amount of Sb^5+ increased further (above 0.5%), Q was decreased by increasing the electron concentration. When the system doped with 0.5% Sb2O5 was sintered at 1 150℃ for 6 h, the relative dielectric constant ε, Qf0, and the temperature coefficient of resonant frequency (TCF) were 38.46, 44 500 GHz, 20.0×10^-6/℃, respectively, at 6 GHz, The microwave dielectric properties of ZrO2-SnO2-TiO2 (ZST) system ceramics were stu- died as a function of the amount of Sb2O5 dopant. With the addition of 0—0.50/0 Sb2O5 (molar ratio), the substitution of Ti 4+ ions with Sb 5+ ions decreased the sintering temperature and increased the quality factor Q due to the reduction of oxygen vacancies. When the amount of Sb 5+ increased further (above 0.50/0), Q was decreased by increasing the electron concentration. When the system doped with 0.50/0 Sb2O5 was sintered at 1 150 ℃ for 6 h, the relative dielectric constant ε, Qf0, and the temperature coefficient of resonant frequency (TCF) were 38.46, 44 500 GHz,20.0×10 -6 /℃, respectively, at 6 GHz.
出处 《Transactions of Tianjin University》 EI CAS 2006年第6期438-441,共4页 天津大学学报(英文版)
基金 Supported by Natural Science Foundation of Tianjin (No.06YFJMJC01000) the High Technique Research and Development Pro-gram of China (No.2001AA325110).
关键词 CERAMICS microwave dielectric properties Sb2O5 dopant 陶瓷工艺 微波介电性能 Sb2O5搀杂 微波陶瓷 ZrO2-SnO2-TiO2
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