摘要
研究了用同步辐射源标定软X光掠入射平面镜的反射率。实验采用北京同步辐射装置（BSRF）-3W1B柬线及反射率计靶室，在50～1500eV能区，做了C，Si，Ni和Au材料平面镜在1^o～7^o掠射角下的反射率标定曲线。由于3W1B束线的单色器采用变间距光栅作色散元件，光栅分光必然存在高次谐波，高次谐波严重影响光源的单色性，从而给平面镜的反射率标定值带来误差。前置滤片虽然能有效抵制高次谐波，但不能完全消除高次谐波。为此，利用透射光栅对光源做了单色性研究，给出高次谐波在不同能区所占光源强度的比例，从而对平面镜反射率标定值做出修正。
The reflectivity calibration and correction of soft X-ray planar mirror is studied. Research is done on the 3W1B beamline of Beijing synchrotron radiation facility for mirrors with several materials, from 50 eV to 1 500 eV, with 40-120 mA beam current and 2 GeV storage ring electron energy. Variable-spacing planar grating on 3W1B generates higher harmonics necessarily, which reduces monochromaticity notably and brings about some errors. Though prefiher is used, limited by the grating dispersion effeciency and X-ray source internsity, there are still some higher harmonics during 300-750 eV. Therefore, the calibrated reflectivity must be corrected.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2007年第8期1308-1312,共5页
High Power Laser and Particle Beams
基金
国家863计划项目资助课题
关键词
同步辐射
软X光平面镜
反射率标定
数据处理
修正
Synchrotron radiation
Soft X-ray
Planar mirror
Reflectivity calibration
Correction
