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Bonding mechanism of ultrasonic wedge bonding of copper wire on Au/Ni/Cu substrate 被引量:1

Bonding mechanism of ultrasonic wedge bonding of copper wire on Au/Ni/Cu substrate
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摘要 The ultrasonic wedge bonding with d25 μm copper wire was achieved on Au/Ni plated Cu substrate at ambient temperature.Ultrasonic wedge bonding mechanism was investigated by using SEM/EDX,pull test,shear test and microhardness test.The results show that the thinning of the Au layer occurs directly below the center of the bonding tool with the bonding power increasing.The interdiffusion between copper wire and Au metallization during the wedge bonding is assumed negligible,and the wedge bonding is achieved by wear action induced by ultrasonic vibration.The ultrasonic power contributes to enhance the deformation of copper wire due to ultrasonic softening effect which is then followed by the strain hardening of the copper wedge bonding. The ultrasonic wedge bonding with d 25 μm copper wire was achieved on Au/Ni plated Cu substrate at ambient temperature. Ultrasonic wedge bonding mechanism was investigated by using SEM/EDX, pull test, shear test and microhardness test. The results show that the thinning of the Au layer occurs directly below the center of the bonding tool with the bonding power increasing. The interdiffusion between copper wire and Au metallization during the wedge bonding is assumed negligible, and the wedge bonding is achieved by wear action induced by ultrasonic vibration. The ultrasonic power contributes to enhance the deformation of copper wire due to ultrasonic softening effect which is then followed by the strain hardening of the copper wedge bonding.
出处 《中国有色金属学会会刊:英文版》 EI CSCD 2008年第1期132-137,共6页 Transactions of Nonferrous Metals Society of China
基金 Prpject(E052104/50705021)supported by the National Natural Science Foundation of China Project(2006:01504489)supported by the Development Program for Outstanding Young Teachers in HIT
关键词 铜导线 超声波焊接 金属学 磨损性能 copper wire ultrasonic wedge bonding bonding mechanism wear action
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  • 1HARMAN G G. Wire bonding in microelectronics-Materials, processes, reliability, and yield [M]. 2nd Edition. New York: McGraw Hill, 1997.
  • 2HO H M, LAM W, STOUKATCH S, RATCHEV P, VATH C J III, BEYNE E. Direct gold and copper wires bonding on copper [J]. Microelectronics Reliability, 2003, 43:913-923.
  • 3MURALI S, SRIKANTH N, VATH C JIII. An analysis of intermetallics formation of gold and copper ball bonding on thermal aging [J]. Materials Research Bulletin, 2003, 38: 637-646.
  • 4JI Hong-jun, LI Ming-yu, WANG Chun-qing, GUAN Jing-wei. Evolution of the bond interface during ultrasonic Al-Si wire wedge bonding process [J]. Journal of Materials Processing Technology, 2007, 182: 202-206.
  • 5MURALI S, SRIKANTH N, VATH C JIII. Grains, deformation substructures, and slip bands observed in thermosonic copper ball bonding [J]. Materials Characterization, 2003, 50: 39-50.
  • 6LUM I, MAYER M, ZHOU Y. Footprint study of ultrasonic wedge-bonding with aluminum wire on copper substrate [J]. Journal of Electronic Materials, 2006, 35(3): 433-442.
  • 7HARMAN G G; ALBERS J. Ultrasonic welding mechanism as applied to aluminum- and gold-wire bonding in microelectronics [J]. IEEE Trans Parts, Hybrids Packaging, 1977, 13:406-411.
  • 8KRZANOWSKI J E, MURDESHWAR N. Deformation and bonding processes in aluminium ultrasonic wire wedge bonding [J]. Journal of Electronic Materials, 1990, 19(9): 919-924.
  • 9LEVINE L. The ultrasonic wedge bonding mechanism: Two theories converge[C].Proceedings of the International Symposium on Microelectronics. Reston, VA, USA: ISHM Press, 1995:128-131.
  • 10LANGENECKER B. Effects of ultrasound on deformation characteristics of metals [J]. IEEE Trans Sorties Ultrasonic, 1966, 13(1): 1-8.

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