摘要
设计和验证周期的不断紧缩,给芯片验证工作者带来了很大的挑战;为了提高验证效率,对芯片的验证方法和验证环境的搭建进行了深入地研究;以"龙腾R2"微处理器总线接口部件为例,详细阐述一种面向对象的功能覆盖率反馈以及自检查验证环境的搭建流程;实验表明,改进后的验证环境在验证效率以及功能点覆盖面方面都明显优于改进前的验证环境。
As the cycle of design and verification are shrinking increasingly, chip verification engineers are faced more and more challenge. To improve verification efficiency, the author make a deep research on verification methodology and verification environment fabrication. This paper gives an detailed exPlanation of the verification environment based on the object-oriented functional coverage feedback and selfcheck technique when design the bus interface of the Longtium R2 microprocessor. The experiment shows that the improved verification environment has priority on the verification efficiency and the functional points coverage over the elder verification environment.
出处
《计算机测量与控制》
CSCD
2008年第6期843-845,871,共4页
Computer Measurement &Control
基金
国家自然科学基金(60573107)。