静态随机访问存储器型现场可编程门阵列辐照效应测试系统研制

Development of measurement system for radiation effect on static random access memory based field programmable gate array

在调研静态随机访问存储器型现场可编程门阵列(FPGA)器件空间辐照效应失效机理的基础上,详细论述FPGA辐照效应测试系统内部存储器测试、功能测试及功耗测试的实现原理,给出了系统的软硬件实现方法。所建立的系统可以测试FPGA器件的配置存储器翻转截面、块存储器翻转截面、功能失效截面、闭锁截面等多个参数,其长线传输距离达到50 m以上,最大可测门数达到了100万门,为FPGA辐照效应研究提供了测试平台。

Based on the detailed investigation in field programmable gate array（FPGA） radiation effects theory, a measurement system for radiation effects on static random access memory（SRAM）-based FPGA was developed. The testing principle of internal memory, function and power current was introduced. The hardware and software implement means of system were presented. Some important parameters for radiation effects on SRAM-based FPGA, such as configuration RAM upset section, block RAM upset section, function fault section and single event latchup section can be gained with this system. The transmission distance of the system can be over 50 m and the maximum number of tested gates can reach one million.