期刊文献+

Mg注入非极性a面GaN退火温度的研究 被引量:1

Study of Mg-doped Nonpolar a-plane GaN Films Annealing Temperature
下载PDF
导出
摘要 非极性GaN材料解决了传统GaN材料中的极化现象,具有较好的应用前景。用金属有机物化学气相沉积方法,在r面蓝宝石上生长了Mg注入非极性a面GaN薄膜,并选取650℃、750℃、850℃这3个温度对Mg注入GaN薄膜进行退火温度研究。用原子力显微镜、光致发光谱、拉曼谱研究了材料的表面形貌、光学性质以及面内应力。结果表明,在750℃退火时效果较好。 The nonpolar GaN materials solve the polarization of conventional GaN materials, and thus have a good prospect of application. Mg-dopoed nonpolar a-plane GaN film is grown on r-plane sapphire by metal organic chemical vapor deposition method, and three temperatures of 650 ℃, 750 ℃ and 850 ℃ are selected to study the annealing temperature of Mg-doped nonpolar GaN films. With an atomic force microscope ( AFM ) , photolumines- cence spectroscopy (PL) and Raman spectra (Raman) , the surface morphology of the material, optical properties, and surface stress are studied. Best results are obtained when annealed at 750 ℃.
出处 《电子科技》 2013年第1期12-15,共4页 Electronic Science and Technology
关键词 非极性 氮化镓 原子力显微镜 光致发光谱 拉曼谱 nonpolar GaN AFM PL Raman
  • 相关文献

参考文献8

  • 1许晟瑞,段焕涛,郝跃,张进城,张金凤,倪金玉,胡仕刚,李志明.(1■02)r面蓝宝石生长的(11■0)a面氮化镓研究[J].西安电子科技大学学报,2009,36(6):1049-1052. 被引量:3
  • 2蔡茂世.Mg掺杂A1GaN的MOCVD生长及表征[M].西安:西安电子科技大学出版社,2011.
  • 3EUNSOON O H, HYEONGSOO P, YONGJO P. Excitation density dependence of photoluminesceace in GaN: Mg [J]. Apply Physics Letter, 1998,72( 1 ) :70 - 72.
  • 4KAUFMANN U, KUNZER M, MAIER M, et al. Origin of de- fect- related photoluminescence bands in doped and nomi- nally undoped GaN [J]. Apply Physics Letter, 1998, 72 (11) :1326 - 1333.
  • 5ISHER S F, ETZEL C W, HALLER E E, et al. On p - type doping in GaN--acceptor binding energies [ J ]. Apply Phys- ics Letter, 1995,67 (9) : 1298 - 1302.
  • 6KAUFMANN U, KUNZER M,MAIER M,et il. Nature of the 2.8 eV photoluminescence band in Mg doped GaN [J]. Ap- ply Physics Letter, 1998,72( 11 ) : 1326 - 1332.
  • 7许晟瑞,周小伟,郝跃,杨林安,张进成,毛维,杨翠,蔡茂世,欧新秀,史林玉,曹艳荣.在r面蓝宝石上生长的a面掺硅GaN的光学和电学性质研究[J].中国科学:技术科学,2011,41(2):234-238. 被引量:1
  • 8XU Chengrui, HAO Yue. Stress and morphology of a nonpolar a - plane GaN layer on r - plane sapphire substrate [ J ]. China Physics B,2011,20(10) :107 -112.

二级参考文献34

  • 1张进城,郝跃,王冲,王峰祥.基于蓝宝石衬底的高性能AlGaN/GaN二维电子气材料与HEMT器件[J].Journal of Semiconductors,2004,25(10):1281-1284. 被引量:1
  • 2Shen L, Keller S, Chakraborty A, et al. Nitride-based High Electron Mobility Transistors with a GaN Spacer[J]. Applied Physics Lerrers, 2006, 89(17): 073508-1-073508-3.
  • 3Ju W T, Daniel A, Gu L, et al. Epitaxial Lateral Overgrowth of Gallium Nitride on Silicon Substrate[J]. Journal of Crystal Growth, 2004, 263(4): 30-34.
  • 4Theeradetch D. Green Light Emitting Diodes on a-plane GaN Bulk Substrates[J]. Applied Physics Letters, 2008, 92 (24) : 241109-1-241109-3.
  • 5Roder C, Einfeldt S, Figge S. Stress and Wafer Bending of a-plane GaN Layers on r-plane Sapphire Substrates[J].Journal of Applied Physics, 2006,100(10): 103511-1-103511-2.
  • 6Wu Feng, Craven M D, Lim S H, et al. Speck Polarity Determination of a-plane GaN on r-plane Sapphire and Its Effects on Lateral Overgrowth and Heteroepitaxy[J].Journal of Applied Physics, 2003, 94(2): 942-947.
  • 7Ni X, Fu Y, Morkoc H B. Optimization of [11-20] a-plane GaN Growth by MOCVD on [1-102] r-plane Sapphire[J].Journal of Crystal Growth, 2006, 290(1) : 166-170.
  • 8Ko T S, Wang T C, Gao R C. Study on Optimal Growth Conditions of a-plane GaN Grown on r-plane Sapphire by Metal-organic Chemical Vapor Deposition[J]. Journal of Crystal Growth, 2007, 300(2):308-313.
  • 9Craven M D, Lim S H, Wu F. Threading Dislocation Reduction Via Laterally Overgrown Nonpolar (11-20) a-plane GaN [J]. Applied Physics Letters, 2002, 81(7): 1201-1203.
  • 10Jursenas S, Kuokstis E, Miasojedovas S, et al. Increase of Free Carrier Lifetime in Nonpolar a-plane GaN Grown by Epitaxial Lateral Overgrowth[J]. Applied Physics Letters, 2004, 85(5): 771-773.

共引文献2

同被引文献5

引证文献1

二级引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部