摘要
Structural and optical properties of ～ 20 nm Ge nanoislands grown on Si（100） by radio frequency （rI） magnetron sputtering under varying annealing conditions are reported. Rapid thermal annealing at a temperature of 600 ℃ for 30 s, 90 s, and 120 s are performed to examine the influence of annealing time on the surface morphology and photoluminescence properties. X-ray diffraction spectra reveal prominent Ge and GeO2 peaks highly sensitive to the annealing time. Atomic force microscope micrographs of the as-grown sample show pyramidal nanoislands with relatively high-density （～ 10^11 cm^-2）. The nanoislands become dome-shaped upon annealing through a coarsening process mediated by Oswald ripening. The room temperature photoluminescence peaks for both as-grown （～ 3.29 eV） and annealed （～ 3.19 eV） samples consist of high intensity and broad emission, attributed to the effect of quantum confinement. The red shift （～ 0.10 eV） of the emission peak is attributed to the change in the size of the Ge nanoislands caused by annealing. Our easy fabrication method may contribute to the development of Ge nanostructure-based optoelectronics.
Structural and optical properties of ～ 20 nm Ge nanoislands grown on Si（100） by radio frequency （rI） magnetron sputtering under varying annealing conditions are reported. Rapid thermal annealing at a temperature of 600 ℃ for 30 s, 90 s, and 120 s are performed to examine the influence of annealing time on the surface morphology and photoluminescence properties. X-ray diffraction spectra reveal prominent Ge and GeO2 peaks highly sensitive to the annealing time. Atomic force microscope micrographs of the as-grown sample show pyramidal nanoislands with relatively high-density （～ 10^11 cm^-2）. The nanoislands become dome-shaped upon annealing through a coarsening process mediated by Oswald ripening. The room temperature photoluminescence peaks for both as-grown （～ 3.29 eV） and annealed （～ 3.19 eV） samples consist of high intensity and broad emission, attributed to the effect of quantum confinement. The red shift （～ 0.10 eV） of the emission peak is attributed to the change in the size of the Ge nanoislands caused by annealing. Our easy fabrication method may contribute to the development of Ge nanostructure-based optoelectronics.
基金
supported by the International Doctoral Fellowship (IDF), Ibnu Sina Institute for Fundamental Science Study and research grants of MoHE GUP. Vot No. 02H94 and 07J80
