期刊文献+

Curved surface effect and emission on silicon nanostructures 被引量:1

Curved surface effect and emission on silicon nanostructures
下载PDF
导出
摘要 The curved surface (CS) effect on nanosilicon plays a main role in the activation for emission and photonic manipulation. The CS effect breaks the symmetrical shape of nanosilicon on which some bonds can produce localized electron states in the band gap. The investigation in calculation and experiment demonstrates that the different curvatures can form the characteristic electron states for some special bonding on the nanosilicon surface, which are related to a series of peaks in photoluminecience (PL), such as LN, LNO, Lo1, and Lo2 lines in PL spectra due to Si-N, Si-NO, Si=O, and Si-O-Si bonds on curved surface, respectively. Si-Yb bond on curved surface of Si nanostructures can provide the localized states in the band gap deeply and manipulate the emission wavelength into the window of optical communication by the CS effect, which is marked as the Lyb line of electroluminescence (EL) emission. The curved surface (CS) effect on nanosilicon plays a main role in the activation for emission and photonic manipulation. The CS effect breaks the symmetrical shape of nanosilicon on which some bonds can produce localized electron states in the band gap. The investigation in calculation and experiment demonstrates that the different curvatures can form the characteristic electron states for some special bonding on the nanosilicon surface, which are related to a series of peaks in photoluminecience (PL), such as LN, LNO, Lo1, and Lo2 lines in PL spectra due to Si-N, Si-NO, Si=O, and Si-O-Si bonds on curved surface, respectively. Si-Yb bond on curved surface of Si nanostructures can provide the localized states in the band gap deeply and manipulate the emission wavelength into the window of optical communication by the CS effect, which is marked as the Lyb line of electroluminescence (EL) emission.
出处 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第10期292-298,共7页 中国物理B(英文版)
基金 Project supported by the National Natural Science Foundation of China(Grant No.11264007)
关键词 silicon nanostructures curved surface effect characteristic line localized states silicon nanostructures, curved surface effect, characteristic line, localized states
  • 相关文献

参考文献19

  • 1Sychugov I, Juhasz R, Valenta J and Linnros J 2005 Phys. Rev. Lett. 94 087405.
  • 2Qin G G, Song H Z, Zhang B R, Lin J, Duan J Q and Yao G Q 1996 Phys. Rev. B 54 2548.
  • 3Vahala K J 2003 Nature 424 839.
  • 4Hirschman K D, Tsybeskov L, Duttagupta S P and Fauchet P M 1996 Nature 384 338.
  • 5Fauchet P M, Ruan J, Chen H, Pavesi L, Negro L DaJ, Cazzaneh M, Elliman R G, Smith N, Smoc M and Luther-Davies B 2005 Opt. Mater. 27745.
  • 6Rong H, Jones R, Liu A, Cohen 0, Hak D, Fang A and Paniccia M 2005 Nature 433 725.
  • 7Chen S, Qian B, Chen K J, Zhang X G, Xu J, Ma Z Y, Li Wand Huang X F 2007 Appl. Phys. Lett. 90 174101.
  • 8Yang Y, Wang C, Yang R D, Li L, Xiong F and Bao J M 2009 Chin. Phys. B 184906.
  • 9Wolkin M V, Jorne J and Fauchet P M 1999 Phys. Rev. Lett. 82 197.
  • 10Huang W Q, Wang H X, Jin F and Qin C J 2008 Chin. Phys. B 1710.

同被引文献2

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部