模数转换器单粒子效应影响因素试验研究

Influence Factors of Single Event Effects on Analog-to-Digital Conventer

本文主要研究了模数转换器(ADC)单粒子效应的测试技术和ADC单粒子效应的影响因素。首先,分析了ADC的单粒子效应失效模式,建立了ADC单粒子效应测试方法和测试系统;其次,以高精度的AD574A为载体,在重离子加速器上开展了单粒子效应试验,研究了ADC的工作频率、输入电压和入射重离子LET值对单粒子效应的影响规律。试验结果表明:随着器件的工作频率增大,ADC单粒子效应截面近似呈线性增大,原因是单粒子瞬时扰动(SET)持续时间远小于ADC的转换周期;ADC输入电压越高,则ADC单粒子效应截面越大,原因是电压增高使得半导体材料中的电场增强,相应的电荷收集能力增强;入射重离子的LET值越高,则ADC单粒子效应截面越大,原因是LET值增加导致单个入射粒子在器件内电离产生的电荷增多,使得敏感位置收集到电荷的概率和电荷量都增大。

In this paper,the test method and system of analog-to-digital converter(ADC)single event effect(SEE)are established.The SEE irradiation experiment for ADC under different working conditions is carried out on the HI-13 tandem accelerator of China Institute of Atomic Energy and the cyclotron of Lanzhou Institute of Modern Physics with high precision AD574A.The influences of SEE on ADC under different operating frequencies,input analog voltages,and LET values are studied.The results show that the SEE cross section of ADC increases linearly with the increase of operating frequency,because the duration of single event transient(SET)of ADC is much smaller than the cycle number of conversion of ADC.It is found that the SEE cross section of ADC increases with the increase of input voltage,which is due to the enhancement of electric field in semiconductor materials and the enhancement of charge collection capacity.It is also found in different LET test that the increase of LET not only increases the ADC SEE cross section,but also increases the amplitude of SET.The probability and the charge quantity of the sensitive position are increased.