大规模集成电路中的互连问题和微波技术

The Interconnection Problem of LSI and Microwave Technology

本文叙述了大规模和超大规模集成电路中当电路规模和工作速度增加时的互连问题,此时互连系统中出现的波效应将十分明显,并将影响集成电路的电性能。为对这种效应进行估算并和集成电路的整体设计相配合,必须与微波理论和方法相结合,本文对这一领域的研究工作进行了概括性的评述。

The problem of the interconnection of LSI and VLSI as the scale and speed of circuits increase is presented in this paper. Under the condition, the wave effects of such interconnection system will be apparent, and will affect the electrical performance of the circuits. For estimating these effects and connecting them with the circuit design, it is necessary to combine with the microwave theories and methods. This paper reviews the research works in this area.