摘要
文章就线结构光三维轮廓测量方法及其实用化做了深入的分析和研究。研制的光刀中心位置获取电路,提高了测量速度;采用双CCD补偿算法来提高系统的测量精度;用最小二乘拟合结构参数的方法来标定光刀在高度方向和轴向的物象相对坐标关系,解决了测量中的标定问题;对物体的分段与分层测量极大地扩展了测量范围。实验结果表明,所开发的线扫描测量机具有较大的测量范围,较高的精度和测量速度,具有很高的实用价值。
In the report,the author makes deep research on three dimensional profile measurement using the method of line structure light.A hardware circuit developed is used to get the center position of light sectioning,and the measuring speed is improved.A double CCDs compensation technology is used to improve the measurement precision.An easy and effective calibration method of the least squares to fit the parameter of system structure is used to get the relative coordinate relationship of objects and images of light section in the directions of height and axis.Sensor scanning segment by segment and layer by layer makes the measurement range greatly expanded.The experimental results show that the line scanning measurement machine has advantages in measurement precision, range and speed, and has great values in applications.
出处
《激光与红外》
CAS
CSCD
北大核心
2003年第6期422-424,共3页
Laser & Infrared
