摘要
为了开发XPS技术对石墨烯粉体中的碳、氧元素含量进行定量测量的特性分析方法,本工作深入考察了表面污染物、仪器参数、扣背底方法等因素对测试结果的影响。为得到有较高分辨率和较好信噪比的XPS谱图,对于石墨烯粉体样品,建议通过能不超过50e V、氧元素结合能采集范围要优于528 eV-538 eV、保证信噪比大于10的采集时间和采集次数、选用Shirley或Smart方法扣背底。
To develop quantitative measurement of C and O elements in graphene powder using XPS,this work investigated the effects of surface contaminants,instrument parameters,background extraction,etc.For obtaining XPS spectrum with higher solution and signal-noise ratio of graphene powder samples,it is suggested that the measurement conditions are pass energy no more than 50 eV,the range of banding energy of O element better than 528 eV-538 eV,collecting time enough for signal-noise ratio no less than 10,and background extraction through Shirley or Smart method.
作者
徐鹏
刘忍肖
XU Peng;LIU Ren-xiao(CAS Key Laboratory of Standardization and Measurement for Nanotechnology,National Center for Nanoscience and Technology)
出处
《中国标准化》
2020年第S01期310-315,共6页
China Standardization
基金
国家重点研发计划NQI专项课题“石墨烯等碳基纳米材料认证认可技术研究与应用”(项目编号:2016YFF0204303)资助
关键词
石墨烯粉体
XPS定量测量
影响因素
grephene powder
XPS quantitative measurement
influence factors
