摘要
缺陷在超大规模集成电路制造过程中不可避免,需要采用集成电路测试技术确保芯片产品质量。对于数字集成电路芯片,必须在设计中添加辅助测试电路以获得满足质量要求的测试覆盖率。介绍了电子设计自动化中的数字电路测试技术及工具,阐述了测试生成和可测试性设计的原理,最后展望了技术的发展趋势。
Defects are unavoidable in manufacturing of very-large-scale integrated circuits.It is essential to adopt techniques of integrated circuit testing to ensure the circuit product quality.For digital circuits,auxiliary test circuits need to be added in each design to achieve acceptable test coverage.The techniques on digital circuit testing and the corresponding tools in electronic design automation are introduced,the principles of test generation and design for testability are discussed,and the development trend is forecasted at last.
作者
李华伟
李晓维
LI Huawei;LI Xiaowei(SKLCA,Institute of Computing Technology,Chinese Academy of Sciences,Beijing 100190,China;University of Chinese Academy of Sciences,Beijing 100049,China)
出处
《微纳电子与智能制造》
2021年第2期28-35,共8页
Micro/nano Electronics and Intelligent Manufacturing
基金
国家自然科学基金(62090024)项目资助
关键词
集成电路
数字电路测试
电子设计自动化
芯片设计
integrated circuit
digital circuit testing
electronic design automation
chip design