期刊文献+

基于GaN的DC/DC变换器总剂量与单粒子辐射损伤效应研究 被引量:1

Research of Total Dose and Single Event Effects of GaN-Based DC/DC Converter
下载PDF
导出
摘要 对基于GaN的DC/DC变换器进行了总剂量、单粒子及耦合辐照效应研究,讨论了DC/DC变换器在特定负载及电压条件下,输出电压、输出电流、输出效率随不同辐照条件的变化。试验结果表明,使用GaN MOSFET开关管的DC/DC变换器在总剂量、单粒子及耦合辐照条件下,均表现出了优异的抗辐照性能,即输出电压、输出电流、输出效率等性能在三种辐照条件下均没有发生明显的退化。该DC/DC变换器实现了抗总剂量辐照能力大于1 kGy(Si)和抗单粒子LET≥75 MeV·cm^(2)·mg^(-1),表明使用基于GaN的DC/DC变换器未来可广泛应用于航空、航天等供电系统领域。 The total dose,single event particle and coupling irradiation effects of GaN-based DC/DC converter were investigated.The variation of output voltage,output current and output efficiency of DC/DC converter with different irradiation conditions under specific load and voltage conditions were discussed.The experimental results show that the DC/DC converter using GaN MOSFET switch tubes exhibits excellent anti-irradiation performance under total dose,single event particle and coupled irradiation conditions,i.e.,the performance of output voltage,output current and output efficiency of the device do not degrade significantly under three different irradiation conditions.The GaN-based DC/DC converter exhibits super resistance to total dose irradiation greater than 1 kGy(Si)and resistance to single event particle with LET≥75 MeV·cm^(2)·mg^(-1),which indicates that this type of DC/DC converter has great potential applications in the future for power supply systems in aviation and aerospace.
作者 张琴 艾尔肯·阿不都瓦衣提 尹华 张炜楠 邓芳 龙涛 李左翰 ZHANG Qin;AIERKEN Abuduwayiti;YIN Hua;ZHANG Weinan;DENG Fang;LONG Tao;LI Zuohan(School of Energy and Environment Science,Yunnan Normal University,Kunming650500,P.R.China;The 24th Research Institute of China Electronics Technology Group Corporation,Chongqing400060,P.R.China)
出处 《微电子学》 CAS 北大核心 2022年第6期1055-1060,共6页 Microelectronics
基金 国防基础科研计划项目(JCKY2019210C031)
关键词 DC/DC变换器 总剂量辐照 单粒子辐照 辐射损伤效应 DC/DC converter total dose irradiation single event effect radiation damage effect
  • 相关文献

参考文献7

二级参考文献26

  • 1贾霞.卫星器件DC/DC抗单粒子效应的研究[J].航天器环境工程,2004,21(1):51-56. 被引量:7
  • 2Pizano J E, Ma T H, Attia J O, et al. Total dose effects on power-MOSFET switching converters[J]. Microelectron Reliab, 1998, 38:1935-1939.
  • 3Adell P C, Schrimpf P D, Choi R D, et al. Total-dose and single-event effects in switching DC/DC power converters[J]. IEEE Trans Nucl Sci, 2002, 49(6): 3217-3221.
  • 4张倩倩.基于PWM的DC/DC转换器辐射损伤预兆单元研究[D].西安:西安电子科技大学,2009.
  • 5Oldham T R, Mclean F B. Totel ionizing dose effects in MOS oxides and devices[J]. IEEE Trans Nucl Sci, 2003, 50(3): 483-499.
  • 6Shaneyfelt M R, Schwank J R, Fleetwood D M, et al. Effects of irradiation temperature on MOS radiation response[J]. IEEE Trans Nucl Sci, 1998, 45(3): 1372-1736.
  • 7McWHORTER P J, MILLER S L, MILLER W M. Modeling the anneal of radiation-induced trapped holes in a varying thermal environment[J]. IEEE Trans Nucl Sci, 1990, 37(6): 1 682-1 689.
  • 8VPT DC-DC converters and accessories for military, avionics, and space applications[M]. [S.l.]: [s.n.], 2008.
  • 9JAMES R, SCHWAN K. Basic mechanisms of radiation effects in the natural space environment[C]∥IEEE Nuclear and Space Radiation Effects Conference Short Course, Section Ⅱ. [S.l.]: [s.n.], 1994: 2-109.
  • 10陈盘训. 半导体器件和集成电路的辐射效应[M]. 北京:国防工业出版社,2002:25-38.

共引文献9

同被引文献2

引证文献1

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部