电子膨胀阀线圈失效研究

Research on coil failure of electronic expansion valve

为研究电子膨胀阀线圈在低温工况下失效的原因,剖析了电子膨胀阀线圈注塑工艺、绕线结构、环境工况及其绝缘层壁厚等之间的关系,发现线圈绝缘层因热胀冷缩引起绝缘层开裂,冷凝水进入线圈细微的裂缝,使线圈的绝缘性能降低,导致线圈失效。

In order to study the cause of the failure of the electronic expansion valve coil under low temperature conditions,this study analyzed the relationship among injection molding process,winding structure,environmental condition and insulation wall thickness of electronic expansion valve coil.Thermal expansion and contraction cause the insulation layer to crack,and condensed water enters the tiny cracks of the coil,which reduces the insulation performance of the coil and causes the coil to fail.