关于芯片去耦电容对EMI影响的研究

Research on the Influence of Chip Decoupling Capacitor on EMI

某变频空调进行骚扰功率测试时出现限值超标的问题。通过对不合格样机进行测试数据分析,并借助频谱分析仪进行近场探测,快速定位干扰源。并针对干扰源特性进行分析,找到问题关键在于芯片电源去耦电容,深入分析去耦电容对EMI影响的关键因素,快速解决该问题,为后续类似问题提供优化思路。

An air conditioner had a problem of exceeding the limit during the disturbance power test.By analyzing the test data of the unqualified prototype,and using the spectrum analyzer for near-field detection,quickly locate the source of interference.According to the analysis of the characteristics of the interference source,the key to the problem lies in the decoupling capacitor of the chip power supply,and the in-depth analysis of the key factors of the influence of the decoupling capacitor on EMI to quickly solve the problem and provide rectification ideas for subsequent similar problems.