CMS-GEM探测器电子学板测试工具的研制

Design of Test Toolkit for CMS-GEM Electronic Board

针对CMS-GEM探测器前端电子学板(GEB)的研制和生产中质量控制的需求,研发了新的自动化测试工具,对电子学板进行连通性和误码率测试。应用基于FPGA的片上系统,提高了测试效率和可靠性,并可自动存储测试结果。该套测试设备已应用在GEB的研制和批量生产质量控制工作中,检验合格的GEB已经运往CERN进行探测器的组装。

The automatic test toolkit was developed for the test of GEM frontend Electronic Board(GEB).The toolkit could validate the function of high speed signal transfer,and provide quality-control test in GEB mass production.The toolkit exhibits high test efficiency and reliability,and could provide automatic logging of digital test result.The bit-error-rate test offers significant references in GEB design process.The test toolkit plays an important role in accomplishing the tasks shared by Peking University in CMS detector upgrade project.