直流偏置电压下的介电常数测量系统设计

Design of Dielectric Constant Measurement System under DC Bias Voltage

本文设计了在直流偏置电压下的介电常数测量系统。本研究采用谐振电路结合数字频率计测量方法,利用其谐振信号的频移获得待测材料的介电常数,并深入探讨了直流偏置电压对材料介电特性的影响。研究结果表明,在不同直流偏置电压下,材料的介电常数呈现显著变化,谐振电路电容测量分辨率最高可达2.95×10^(-3)MHz/p F,稳定度可达10^(-3)MHz。

This article presents the design of a dielectric constant measurement system under a direct current(DC)bias voltage.The study utilizes a resonant circuit combined with a digital frequency meter to measure the dielectric constant of the material under test by observing the frequency shift of the resonant signal.The impact of the DC bias voltage on the dielectric properties of the material is also thoroughly explored.The results indicate that the dielectric constant of the material exhibits significant changes under different DC bias voltages.The resonant circuit achieves a maximum capacitance measurement resolution of 2.95×10^(-3)MHz/pF with a stability of 10^(-3)MHz.