基于故障类型的高效March算法构造

Construction of High-efficient March Algorithms Based on Fault Model

March算法是一系列用以测试片上随机存储器的测试算法,通过搭配存储器内的内建自测试系统(mBIST)与功能故障模型,可以检测存储器中存在的故障。March算法的优劣直接影响到存储器的测试效率,其评判指标为故障覆盖率和时间复杂度。通过分析March算法的结构、读写操作与故障检测方式的关系,提出了一种March算法的构造方法,通过其构造的两种March算法在保证故障覆盖种类不变的情况下,时间复杂度减少了5.7%与1.3%,从而减少了测试时间。

March algorithms are a series of algorithms used to test random access memories on chip.With the help of memory Built-In-Self-Test(mBIST)system and function faulty model,march algorithms can be used to detect faults in memories.The evaluation standard of march algorithms is fault coverage and time complexity,which have a direct influence on test efficiency.The architecture of multiple march algorithms will be discussed in this article,aiming at analyzing the relationship between march read/write sequences and the way of fault sensitization and detection.In this paper,a march construction method and modified march algorithms are proposed,by which time complexity decreases and fault coverage remains the same.As a result,test time reduces.