基于STM32F103主控芯片的电路特性测试方法

Circuit Characteristic Test Method Based on STM32F103 Main Control Chip

设计的电路特性测试仪选用STM32F103为主控芯片,DDS芯片AD9854为正弦波信号源输出,OPA365构成小信号放大电路,AD637为有效值采样芯片对被测电路的输入输出波形的进行有效值转换,利用单片机AD端口进行采样,可以实现被测电路输入电阻、输出电阻、增益、幅频特性曲线的自动测量。当电路的元器件发生变化时,利用这些参数特征自动判断引起故障或变化的原因。

In this paper,STM32 F103 is selected as the main control chip,DDS chip AD9854 is used as the sine wave signal source output,opa365 is used to form small signal amplification circuit,AD637 is the effective value sampling chip to convert the effective value of the input and output waveforms of the circuit under test.The input resistance,output resistance,gain and amplitude of the circuit under test can be realized by using the ad port of a single chip computer for sampling automatic measurement of frequency characteristic curve.When the components of the circuit change,these parameters can be used to automatically determine the cause of the fault or change.