摘要
某电磁炉样机进行静电放电测试时,出现触摸按键受干扰误触发"童锁"模式问题。通过分析静电干扰的传播路径,发现电磁炉微晶玻璃面板在静电高压状态下存在局部击穿现象,静电干扰经过微晶面板后以传导耦合的方式干扰了电磁炉芯片电路,导致静电放电测试失效。
During the electrostatic discharge test of an induction furnace prototype,the touch key was disturbed and the "child lock" mode was triggered by mistake.Through the analysis of the propagation path of electrostatic interference,it is found that there is partial breakdown in the microcrystalline glass plate of the induction furnace under electrostatic high voltage.After the electrostatic interference passes through the microcrystalline panel,it interferes with the circuit of the induction furnace chip in the way of conduction coupling,resulting in the failure of the electrostatic discharge test.
关键词
静电放电
微晶玻璃板
高压击穿
ESD
microcrystalline glass plate
high voltage breakdown