基于信号传输完整性的通用测试接口板设计

Design of universal test interface board based on signal integrity

针对通用测试接口板存在设计不合理导致信号传输不完整的问题,基于UltraFLEX大规模集成电路测试设备(ATE)的资源,以及数字集成电路通用测试接口板设计需求,提出基于信号传输反射、串扰、阻抗控制原理的通用测试接口板设计方法,完成了测试母板和通用测试子板的PCB设计,通过反射和串扰信号完整性仿真分析,验证了通用测试接口板能够满足测试资源与待测器件连接的设计目标。以74LS245数字器件为例,对通用测试板进行测试验证,验证设计方法的有效性。

To the incomplete signal transmission problem from improper design of universal test interface board of automatic test equipment(ATE),a universal test interface board design method which consider the principles of reflection,crosstalk and impedance control in signal transmission was proposed in this paper.The design requirement was analyzed.The PCB of test motherboard and universal test daughter board was designed based on the related test resources of an UltraFLEX automatic test equipment.A signal integrity simulation and analysis of reflection and crosstalk was carried out to verify the effective connection of test resources and device under test(DUT).A 74 LS245 digital device was used as an example and it was tested on the universal test board.The test result validated the effectiveness of design method.